The refractive index of thin silicon dioxide films deposited by using a CO₂ laser, 1973

Item — Call Number: MU Thesis Joh

Identifier: b2088650

Staff Only

Scope and Contents

From the Collection:

The collection consists of theses written by students enrolled in the Monmouth College graduate Physics program. The holdings are bound print documents that were submitted in partial fulfillment of requirements for the Master of Science degree.

Dates

Creation: 1973

Creator

Johnson, Ronald F. (Ronald Frederic) (Author, Person)
Barnes, Derek A. (Thesis advisor, Person)
Hieslmair, Hans (1932-2021) (Thesis advisor, Person)

Conditions Governing Access

The collection is open for research use. Access is by appointment only.

Access to the collection is confined to the Monmouth University Library and is subject to patron policies approved by the Monmouth University Library.

Collection holdings may not be borrowed through interlibrary loan.

Research appointments are scheduled by the Monmouth University Library Archives Collections Manager (723-923-4526). A minimum of three days advance notice is required to arrange a research appointment for access to the collection.

Patrons must complete a Researcher Registration Form and provide appropriate identification to gain access to the collection holdings. Copies of these documents will be kept on file at the Monmouth University Library.

Extent

1 Items (print book) : 47 pages ; 8.5 x 11.0 inches (28 cm).

Language of Materials

English

Additional Description

Abstract

A CO₂ laser was employed as the heat source to deposit films of SiO₂. The report discusses the measurement of the refractive indices of the thin transparent films produced.

Investigation into the various techniques available for measuring the index of refraction led to the selection of Abeles method for determination of the Brewster angle. A helium-neon laser was used as the source of incident polarized light, while a selenium photocell monitored the reflected beam.

Comparison was made with the independent results obtained by [Stanley H.] Levine and [Tonis] Vaga. Agreement was attained with Vaga, while the older samples of Levine were found to be of too poor quality and too thin to be measured accurately.

The abeles [sic] method as implemented, was found to be extremely suitable for measuring the refractive indices of thin transparent films on transparent substrates of like refractive indices. The accuracy of the data obtained was acceptable for the purposes described, but, greater accuracies could be attained by refining the measuring apparatus.

Partial Contents

Abstract -- Contents -- Acknowledgments -- Introduction -- Preparation of the films -- Measurement technique -- Results and discussion -- Conclusion -- Appendix A. Derivation of Brewster's Law -- Appendix B. Uniform plane wave propagation -- Appendix C. Derivation of relation between the electric and magnetic field vectors -- Appendix D. Data -- References.