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Thin films -- Optical properties

 Subject
Subject Source: Library Of Congress Subject Headings

Found in 2 Collections and/or Records:

Investigation of reflectance from multi-layered dielectric films, 1970

 Item — Multiple Containers
Identifier: b2089520
Abstract An investigation was conducted to determine the reflectivity of multi-layered dielectric films. The theory was developed for oblique and normal incidence, including vertical and horizontal linear polarization, for single, double and higher order stacks by considering the propagation of a plane, time-harmonic electro-magnetic wave through a stratified medium, including the use of characteristic matrices. Computer programs were written and the theoretical curves obtained for reflectance of...
Dates: 1970

The refractive index of thin silicon dioxide films deposited by using a CO₂ laser, 1973

 Item — Call number MU Thesis Joh
Identifier: b2088650
Abstract A CO₂ laser was employed as the heat source to deposit films of SiO₂. The report discusses the measurement of the refractive indices of the thin transparent films produced. Investigation into the various techniques available for measuring the index of refraction led to the selection of Abeles method for determination of the Brewster angle. A helium-neon laser was used as the source of incident polarized light, while a selenium photocell monitored the reflected...
Dates: 1973