An investigation of the switching characteristics of the As-Te-Ge glass, 1972

Item — Call Number: MU Thesis Lev

Identifier: b2088517

Staff Only

Scope and Contents

From the Collection:

The collection consists of theses written by students enrolled in the Monmouth College graduate Physics program. The holdings are bound print documents that were submitted in partial fulfillment of requirements for the Master of Science degree.

Dates

Creation: 1972

Creator

Levy, Joseph A. (Author, Person)
Smith, Robert O. (Robert Owens) (Thesis advisor, Person)
Mallikarjun, S. (Srikantaiah) (1933-2024) (Data contributor, Person)

Conditions Governing Access

The collection is open for research use. Access is by appointment only.

Access to the collection is confined to the Monmouth University Library and is subject to patron policies approved by the Monmouth University Library.

Collection holdings may not be borrowed through interlibrary loan.

Research appointments are scheduled by the Monmouth University Library Archives Collections Manager (723-923-4526). A minimum of three days advance notice is required to arrange a research appointment for access to the collection.

Patrons must complete a Researcher Registration Form and provide appropriate identification to gain access to the collection holdings. Copies of these documents will be kept on file at the Monmouth University Library.

Extent

1 Items (print book) : 58 pages ; 8.5 x 11.0 inches (28 cm).

Language of Materials

English

Additional Description

Abstract

This is a report on an experimental investigation into the switching characteristics of the As-Te-Ge glass undertaken in the Physics Department of Monmouth College. The report describes the preparation of the amorphous samples, discusses associated semiconductor theory, and presents a discussion on the results obtained. Graphs of log resistance vs 1/T for this glassy system are presented which clearly show an intrinsic conduction range down to about 40°C. Some evidence in the date of an extrinsic range below this temperature have since been refuted by more recent data obtained with improved equipment. These later data show intrinsic behavior down to -100°C. The threshold switching phenomenon is discussed and sample data are exhibited which reveal a strong dependence of the switching voltage on the sample temperature approaching zero around 200°C to 225°C. The results of the investigation, supported by x-ray diffraction studies which are also briefly discussed, indicate that the switching phenomenon is a thermal one.