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Klohn, Kenneth L. (Kenneth Leon)

 Person

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Investigation of reflectance from multi-layered dielectric films, 1970

 Item — Multiple Containers
Identifier: b2089520
Abstract An investigation was conducted to determine the reflectivity of multi-layered dielectric films. The theory was developed for oblique and normal incidence, including vertical and horizontal linear polarization, for single, double and higher order stacks by considering the propagation of a plane, time-harmonic electro-magnetic wave through a stratified medium, including the use of characteristic matrices. Computer programs were written and the theoretical curves obtained for reflectance of...
Dates: 1970