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Experimental measurements of semiconductor conductivity using a high sensitivity technique, 1971

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Identifier: b2087791
Abstract An experimental study of a reflection cavity scheme used to measure changes in the conductivity of semiconductor samples is presented. The germanium sample with associated microwave circuitry acts as a highly sensitive system where by in the null condition almost complete absorption occurs. Changes in conductivity from the null point will cause a sharp increase in reflected microwave power. This change in reflected power may be used to measure a change in conductivity, or in a device...
Dates: 1971